Multi-state device redundant systems with common-cause failures and one standby unit-Reference-Cited by-同舟云学术

Multi-state device redundant systems with common-cause failures and one standby unit

Published:1980-01 Issue:4 Volume:20 Page:411-417
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Dhillon Balbir S

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference5 articles.

1. On Common-Cause Failures — Bibliography;Dhillon;Microelectron, Reliab.,1979

2. A 1-out-of-N:G System With Duplex Elements;Dhillon;IEEE Trans. Reliab.,1979

3. Literature Survey on Three-state Device Reliability Systems;Dhillon;Microelectron Reliab.,1977

4. A 4-Unit Redundant System With Common-Cause Failure;Dhillon;IEEE Trans. Reliab.,1979

5. The Analysis of Non-Markovian Stochastic Processes by Supplementary Variables;Cox,1955

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