Shock models and testing for the renewal mean remaining life classes-Reference-Cited by-同舟云学术

Shock models and testing for the renewal mean remaining life classes

Published:1993-04 Issue:5 Volume:33 Page:729-740
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Abouammoh A.M.,Ahmed A.N.,Barry A.M.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference18 articles.

1. On the criteria of the mean remaining life;Abouammoh;Statist. Prob. Lett.,1988

2. Two ageing concepts based on comparisons with the renewal mean remaining life;Abouammoh,1991

3. Likelihood ratio for restricted families of probability distributions;Barlow;Ann. Math. Statist.,1968

4. Nonstationary shock models;A-Hameed;Stoch. Process. Appl.,1973

5. Statistical Theory of Reliability and Life Testing;Barlow,1981

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