Synergistic effects of additives on impurity residues in high-speed copper electrodeposition and voiding propensity in solder joints

Author:

Tsai Kun-Lin,Chen Chih-MingORCID,Ho Cheng-EnORCID

Funder

National Science and Technology Council

Publisher

Elsevier BV

Reference60 articles.

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5. Redistribution layers (RDLs) for 2.5D/3D IC integration. International Symposium on Microelectronics;Lau;Int Microelectron Assembly Packag Soc,2013

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