Fabrication of ultra-sharp tips from carbon fiber for scanning tunneling microscopy investigations of epitaxial graphene on 6H-SiC(0001) surface

Author:

Morán Meza J.A.,Lubin C.,Thoyer F.,Villegas Rosales K.A.,Gutarra Espinoza A.A.,Martin F.,Cousty J.

Funder

Peru’s National Council of Science and Technology

Réseau Thématique de Recherche Avancée

CEA/Direction des Relations Internationales

Publisher

Elsevier BV

Subject

General Chemistry,General Materials Science

Reference55 articles.

1. Atomic force microscope;Binnig;Phys Rev Lett,1986

2. Scanning tunneling microscopy;Binnig;Helv Phys Acta,1982

3. The art and science and other aspects of making sharp tips;Melmed;J Vac Sci Technol B,1991

4. Reproducible sharp-pointed tip preparation for field ion microscopy by controlled ac polishing;Morikawa;Rev Sci Instrum,1988

5. Tip sharpening by normal and reverse electrochemical etching;Fotino;Rev Sci Instrum,1993

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