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Electromigration in Thin Films

Published:1973 Issue: Volume: Page:257-310
ISSN:0079-1970
Container-title:Physics of Thin Films - Advances in Research and Development
language:
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Author:

D'heurle F.M.,Rosenberg R.

Publisher

Elsevier

Reference116 articles.

1. Electrotransport in metals;Verhoeven;Met. Rev.,1963

2. Some predicted effects of temperature gradients on diffusion in crystals;LeClaire;Phys. Rev.,1954

3. Driving forces for thermal mass transport;Huntington;J. Phys. Chem. Solids,1968

4. Thermomigration in solid metals;Oriani;J. Phys. Chem. Solids,1969

Cited by 67 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. A Critical Review on the Electromigration Effect, the Electroplastic Effect, and Perspectives on the Effects of Electric Current Upon Alloy Phase Stability;JOM;2019-07-26

3. Electromigration kinetics and critical current of Pb-free interconnects;Applied Physics Letters;2014-04-07

4. The Changing Physics in Metal Interconnect Reliability;Ceramic Integration and Joining Technologies;2011-10-24

5. Electromigration in electroplated Cu(Ag) alloy thin films investigated by means of single damascene Blech structures;Microelectronic Engineering;2009-12

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