Optical conductivity of semiconductor crystals with a screw dislocation
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Condensed Matter Physics,General Chemistry
Reference37 articles.
1. Measurement of screw and edge dislocation density by means of X-ray Bragg profile analysis
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3. Contribution of x-ray topography and high-resolution diffraction to the study of defects in SiC
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