Calculation of the extreme-ultraviolet radiation conversion efficiency for a laser-produced tin plasma source

Author:

Masnavi Majid,Parchamy Homaira

Publisher

Elsevier BV

Subject

General Physics and Astronomy

Reference38 articles.

1. 2 - extreme ultraviolet (EUV) lithography;Rice,2014

2. I. Fomenkov, EUV source for high volume manufacturing: performance at 250 W and key technologies for power scaling, in: Source Workshop, November 6-8 (2017), Dublin, Ireland. URL https://www.euvlitho.com/2017/S1.pdf.

3. H. Nakarai, T. Abe, K. M. Nowak, Y. Kawasuji, H. Tanaka, Y. Watanabe, T. Hori, T. Kodama, Y. Shiraishi, T. Yanagida, G. Soumagne, T. Yamada, T. Yamazaki, T. Saitou, High power LPP-EUV source with long collector mirror lifetime for high volume semiconductor manufacturing, in: Source Workshop, November 6-8 (2017), Dublin, Ireland. URL https://www.euvlitho.com/2017/S41.pdf.

4. Plasma physics and radiation hydrodynamics in developing an extreme ultraviolet light source for lithography;Nishihara;Phys. Plasmas,2008

5. Physical processes in EUV sources for microlithography;Banine;J. Phys. D Appl. Phys.,2011

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