Characterisation of interfacial properties in sputtered Co/Cu multilayers: X-ray reflectometry compared with TEM and AFM
Author:
Publisher
Elsevier BV
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference8 articles.
1. Oscillatory magnetic exchange coupling through thin copper layers
2. Vertical inhomogeneity of the magnetization reversal in antiferromagnetically coupled Co/Cu multilayers at the first maximum
3. Giant magnetoresistance of Co/Cu multilayers with and without Fe buffer layers
4. Complex AF coupling for Cu-Co multilayers with low copper thickness
5. Linear defects in GMR multilayers
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2. Interdiffusion Phenomena and Magnetic Properties of Deposited Co/Cu/Co Trilayers on Silicon Wafers;Science of Advanced Materials;2018-09-01
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