Assessment of Subsurface Damage in Ultraprecision-Machined CdS by Ion Channeling
Author:
Publisher
Elsevier BV
Subject
Industrial and Manufacturing Engineering,Mechanical Engineering
Reference12 articles.
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4. Algorithms for the Rapid Simulation of Rutherford Backscattering Spectra;Doolittle;Nuclear Inst. Meth. Phys. Res.,1985
5. Materials Analysis by Ion Channeling: Submicron Crystallography.;Feldman,1982
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