Current reliability issues and future technologies for systems on silicon – processes, circuits, chip architecture, and design
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Published:2000-06
Issue:6
Volume:40
Page:897-908
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ISSN:0026-2714
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Container-title:Microelectronics Reliability
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language:en
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Short-container-title:Microelectronics Reliability
Author:
Takeda Eiji,Watanabe Takao,Kimura Shinichiro,Yugami Jiro,Haraguchi Keiichi,Suzuki Kei,Sasaki Katsuro
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference31 articles.
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4. International Technology Roadmap for Semiconductors, updated 1998, Semiconductor Industry Association