1. Thin gate oxide technology;Demoulin,1983
2. Defects and impurities in thermal SiO2;Dimaria,1978
3. Hot carrier injection in oxides and the effect on MOSFET reliability;Balk,1983
4. Charge trapping in SiO2;De Keersmaecker,1983
5. High temperature annealing behaviour of electron traps in thermal SiO2;Balk;Solid State Electron.,1984