Comparative analysis of strain engineering on the electronic properties of homogenous and heterostructure bilayers of MoX2 (X = S, Se, Te)
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Published:2022-08
Issue:
Volume:168
Page:207334
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ISSN:2773-0123
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Container-title:Micro and Nanostructures
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language:en
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Short-container-title:Micro and Nanostructures
Author:
Palepu Joshna,
Anand P. Pranav,
Parshi Pradyumna,
Jain Vishesh,
Tiwari Aditya,
Bhattacharya Sandip,
Chakraborty Sudipta,
Kanungo SayanORCID
Cited by
17 articles.
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