Validity of Thin Element Approximation in diffractometry of opaque thick objects-Reference-Cited by-同舟云学术

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Validity of Thin Element Approximation in diffractometry of opaque thick objects

Published:2024-09 Issue: Volume:311 Page:171900
ISSN:0030-4026
Container-title:Optik
language:en
Short-container-title:Optik

Author:

Sanchez-Brea Luis Miguel^ORCID,Soria-Garcia Angela^ORCID,Andres-Porras Joaquin,del Hoyo Jesus^ORCID,Torcal-Milla Francisco Jose,Elshorbagy Mahmoud Hamdy,Pastor-Villarrubia Veronica^ORCID,Alda Javier^ORCID

Funder

Ministerio de Ciencia e Innovación

Gobierno de España Ministerio de Ciencia e Innovación

Publisher

Elsevier BV

Reference31 articles.

1. Absorption and Scattering of Light by Small Particles;Bohren,2008

2. Geometrical theory of diffraction;Keller;J. Opt. Soc. Am.,1962

3. Geometrical Theory of Diffraction for Electromagnetic Waves;James,1986

4. Geometrical Theory of Diffraction;Borovikov,1994

5. Electromagnetic Simulation Using the FDTD Method;Sullivan,2013

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