Burst-type noise mechanisms in bipolar transistors-Reference-Cited by-同舟云学术

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Burst-type noise mechanisms in bipolar transistors

Published:1989-11 Issue:11 Volume:32 Page:1039-1042
ISSN:0038-1101
Container-title:Solid-State Electronics
language:en
Short-container-title:Solid-State Electronics

Author:

Wu X.L.,van der Ziel A.,Birbas A.N.,van Rheenen A.D.

Publisher

Elsevier BV

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference9 articles.

1. Recombination of Electrons and Holes at Dislocations

2. Study of1fNoise in Semiconductor Filaments

3. Effects of dislocations on the noise of planar p–n junctions†

4. Effects of diffusion-induced dislocations on the excess low-frequency noise

5. Effects of emitter edge dislocations on the low frequency noise of silicon planar n-p-n transistors

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