Author:
Zanoni Enrico,Grasso Gaetano,Muschitiello Michele,Rizzi Giuseppe,Stucchi Michele,Bonati Bruno
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference10 articles.
1. Hot-electron resistant device processing and design: a review;Sanchez;IEEE Trans. on Semiconductor Manufacturing,1989
2. Modeling and characterization of CMOS compatible high-voltage device structures;Parpia;IEEE Trans. on El. Devices,1987
3. The effects of interconnect process and snapback voltage on the ESD failure threshold of nMOS transistors;Kueing-Long;IEEE Trans. on El. Dev.,1988
4. Deficiencies in ESD testing methodologies highlighted by failure analysis;Taylor,1985
5. A programmable equipment for ESD testing to the charged-device model;Shaw,1986
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献