Author:
Stevens Keith C.,Wilson Thomas J.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference5 articles.
1. A Laser Scanner for Integrated Circuit Testing;McMahon,1972
2. Laser Scanning of MOS IC's Reveals Logic States Non-destructively;Sawyer,1976
3. Laser Die Probing for Complex CMOS;Pronobis;International Symposium for Testing and Failure Analysis,1982
4. Latchup in CMOS Technology
Cited by
14 articles.
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