X-ray multiple diffraction on the shallow junction of B in Si(001)
Author:
Publisher
Elsevier BV
Subject
Physical and Theoretical Chemistry,Process Chemistry and Technology,Catalysis
Reference14 articles.
1. Analysis of interfacial misfit dislocation by X-ray multiple diffraction
2. Observation of coherent hybrid reflection with synchrotron radiation
3. Piezoelectric Coefficients of mNA Organic Nonlinear Optical Material Using Synchrotron X-Ray Multiple Diffraction
4. Synchrotron-radiation x-ray multiple diffraction applied to the study of electric-field-induced strain in an organic nonlinear optical material
5. Habit modification of nearly perfect single crystals of potassium dihydrogen phosphate (KDP) by trivalent manganese ions studied using synchrotron radiation X-ray multiple diffraction in Renninger scanning mode
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1. Experimental evidence of transition between dynamical and kinematical diffraction regimes in ion-implanted Si observed through X-ray multiple-beam diffraction mappings;Applied Physics Letters;2016-10-03
2. Lattice strain distribution resolved by X-ray Bragg-surface diffraction in an Si matrix distorted by embedded FeSi2nanoparticles;Journal of Applied Crystallography;2013-11-07
3. Assessment of the out-plane and in-plane ordering of high quality ZnO nanorods by X-ray multiple diffraction;Thin Solid Films;2013-08
4. On the effect of Au2+ion irradiation in an amorphous Fe–Si thin layer synthesized by ion implantation: a high resolution X-ray diffraction study;CrystEngComm;2013
5. X-ray Bragg-Surface Diffraction: A Tool to Study In-Plane Strain Anisotropy Due to Ion-Beam-Induced Epitaxial Crystallization in Fe+-Implanted Si(001);Crystal Growth & Design;2010-09-16
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