Determination of the short wavelength cutoff of interferential and confocal microscopes

Author:

Krüger-Sehm Rolf,Frühauf Joachim,Dziomba Thorsten

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Mechanics of Materials,Condensed Matter Physics

Reference5 articles.

1. DIN EN ISO 3274, International Organisation of Standardisation ISO, Geometrical Product Specification (GPS) Surface Texture: Profile Method; Nominal Characteristics of Contact Stylus Instruments, 1996.

2. Optics;Hecht,1998

3. Tiefen- und Längennormale aus Silizium;Frühauf;Technisches Messen,2001

4. DIN EN ISO 5436-1, International Organisation of Standardisation ISO, Geometrical Product Specification (GPS) Surface texture. Measurement Standards. Part 1. Material Measures, 1998.

5. VDI 2655-1 Blatt 1.1 draft (bilingual), Optische Messtechnik an Mikrotopographien: Kalibrieren von Interferenzmikroskopen und Tiefeneinstellnormalen für die Rauheitsmessung; Optical Measurement and Microtopographies: Calibration of Interference Microscopes and Depth Measurement Standards for Roughness Measurement, 2005.

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