Measuring thermal conductivity of thin films by Scanning Thermal Microscopy combined with thermal spreading resistance analysis
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference28 articles.
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5. Thermal microscopy of electronic materials;Heiderhoff;Mater. Sci. Semicond. Process.,2016
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