Author:
Alkorta Jon,Marteleur Matthieu,Jacques Pascal J.
Funder
Belgian State, Belgian Science Policy
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference29 articles.
1. Image-processing procedures for analysis of electron back scattering patterns;Krieger-Lassen;Scanning Microsc.,1992
2. A.J. Schwartz, M. Kumar, B.L. Adams, Electron backscatter diffraction in materials science, Kluwer Academic/Plenum Publishers, New York, 2000.
3. High resolution mapping of strains and rotations using electron backscatter diffraction;Wilkinson;Mater. Sci. Technol.,2006
4. High-resolution elastic strain measurement from electron backscatter diffraction patterns: new levels of sensitivity;Wilkinson;Ultramicroscopy,2006
5. High-resolution electron backscatter diffraction: an emerging tool for studying local deformation;Wilkinson;J. Strain Anal. Eng. Des.,2010
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