Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Cited by
3 articles.
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1. Defect analysis by statistical fitting to 3D atomicmaps;Ultramicroscopy;2013-09
2. Electron Holography;Handbook of Nanoscopy;2012-05-23
3. Electron crystallography based on inverse dynamic scattering;Acta Crystallographica Section A Foundations of Crystallography;2011-08-22