Author:
Schramm S.M.,Pang A.B.,Altman M.S.,Tromp R.M.
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference30 articles.
1. Low-energy electron microscopy for nanoscale characterization;Hannon,2011
2. Trends in low energy electron microscopy
3. Fourier optics of image formation in LEEM
4. High Resolution Electron Microscopy;Spence,2003
5. Transmission Electron Microscopy: A Textbook for Materials Science, Part III: Imaging;Williams,1996
Cited by
44 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献