Atom probe tomography and transmission electron microscopy of a Mg-doped AlGaN/GaN superlattice-Reference-Cited by-同舟云学术

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Atom probe tomography and transmission electron microscopy of a Mg-doped AlGaN/GaN superlattice

Published:2011-02 Issue:3 Volume:111 Page:207-211
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Bennett S.E.,Ulfig R.M.,Clifton P.H.,Kappers M.J.,Barnard J.S.,Humphreys C.J.,Oliver R.A.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference12 articles.

1. First Data from a Commercial Local Electrode Atom Probe (LEAP)

2. Mg Segregation atAl/Al3ScHeterophase Interfaces on an Atomic Scale: Experiments and Computations

3. Three-Dimensional Atomic-Scale Imaging of Impurity Segregation to Line Defects

4. Imaging of Arsenic Cottrell Atmospheres Around Silicon Defects by Three-Dimensional Atom Probe Tomography

5. Polarization-enhanced Mg doping of AlGaN/GaN superlattices

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4. Atom probe tomography of hyper-doped Ge layers synthesized by Sb in-diffusion by pulsed laser melting;Materials Science in Semiconductor Processing;2023-09

5. Direct Observation of Atomic Structures and Chemical States of Active and Inactive Dopant Sites in Mg-Doped GaN;ACS Applied Electronic Materials;2022-09-15

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