Pattern matching analysis of electron backscatter diffraction patterns for pattern centre, crystal orientation and absolute elastic strain determination – accuracy and precision assessment-Reference-Cited by-同舟云学术

Pattern matching analysis of electron backscatter diffraction patterns for pattern centre, crystal orientation and absolute elastic strain determination – accuracy and precision assessment

Published:2019-07 Issue: Volume:202 Page:87-99
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Tanaka Tomohito,Wilkinson Angus J.^ORCID

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference44 articles.

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4. Accuracy assessment of elastic strain measurement by EBSD;Villert;J. Microsc.,2009

5. Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films;Vilalta-Clemente;Acta Mater.,2017

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