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Simultaneous multi-region background subtraction for core-level EEL spectra

  • Published:2020-03 Issue: Volume:210 Page:112919
  • ISSN:0304-3991
  • Container-title:Ultramicroscopy
  • language:en
  • Short-container-title:Ultramicroscopy

Author:

Held Jacob T.,Yun Hwanhui,Mkhoyan K. Andre

Funder

National Science Foundation

University of Minnesota

Semiconductor Research Corporation

Samsung

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference14 articles.

1. Electron Energy-Loss Spectroscopy in the Electron Microscope;Egerton,2011

2. Influence of some practical factors on background extrapolation in eels quantification;Liu;J. Microsc.,1987

3. A new background subtraction for low-energy eels core edges;Tenailleau;J. Microsc.,1992

4. Improved background-fitting algorithms for ionization edges in electron energy-loss spectra;Egerton;Ultramicroscopy,2002

5. Model based quantification of EELS spectra;Verbeeck;Ultramicroscopy,2004

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