Robust methodology for the EBSD local misorientation analysis of surface cold work-Reference-Cited by-同舟云学术

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Robust methodology for the EBSD local misorientation analysis of surface cold work

Published:2024-12 Issue: Volume:266 Page:114007
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Bogachev Ivan,Knowles Kevin M.^ORCID,Gibson Grant J.

Funder

Rolls-Royce plc

University of Cambridge St Catharine's College

Publisher

Elsevier BV

Reference33 articles.

1. Electron Backscatter Diffraction in Materials Science;Schwartz,2009

2. Diffraction of cathode rays by mica;Kikuchi;Jpn. J. Phys.,1928

3. Automatic analysis of electron backscatter diffraction patterns;Wright;Met. Trans. A,1992

4. Scanning Electron Microscopy and X-Ray Microanalysis;Goldstein,2018

5. Orientation imaging: the emergence of a new microscopy;Adams;Met. Trans. A,1993

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