Fourier transform-based post-processing drift compensation and calibration method for scanning probe microscopy
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Published:2024-09
Issue:
Volume:263
Page:113984
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ISSN:0304-3991
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Container-title:Ultramicroscopy
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language:en
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Short-container-title:Ultramicroscopy
Author:
Le Ster M.ORCID,
Pawłowski S.,
Lutsyk I.,
Kowalczyk P.J.ORCID
Funder
Uniwersytet Łódzki
Narodowym Centrum Nauki
Narodowe Centrum Nauki