Feasibility of multi-walled carbon nanotube probes in AFM anodization lithography-Reference-Cited by-同舟云学术

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Feasibility of multi-walled carbon nanotube probes in AFM anodization lithography

Published:2007-10 Issue:10-11 Volume:107 Page:1091-1094
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Sun Choi Ji,Bae Sukjong,Jung Ahn Sang,Hyun Kim Dal,Young Jung Ki,Han Cheolsu,Choo Chung Chung,Lee Haiwon

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference18 articles.

1. Local oxidation of silicon surfaces by dynamic force microscopy: Nanofabrication and water bridge formation

2. Atomic force microscope tip-induced local oxidation of silicon: kinetics, mechanism, and nanofabrication

3. Mechanisms of surface anodization produced by scanning probe microscopes

4. Selective growth of nanometre scale structures with high resolution using thermal energy in AFM lithography

5. Surface Functional Group Effect on Atomic Force Microscope Anodization Lithography

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Line Patterning using a Scanning Probe Lithography Technique based on Convolution Method^#;Bulletin of the Korean Chemical Society;2015-02-20

2. Scanning Probe Microscopy as a Tool for the Fabrication of Structured Surfaces;Nanotechnology;2010-09-15

3. Identification of multiple oscillation states of carbon nanotube tipped cantilevers interacting with surfaces in dynamic atomic force microscopy;Physical Review B;2009-12-17

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