Atom probe specimen fabrication methods using a dual FIB/SEM-Reference-Cited by-同舟云学术

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Atom probe specimen fabrication methods using a dual FIB/SEM

Published:2007-09 Issue:9 Volume:107 Page:756-760
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Saxey D.W.,Cairney J.M.,McGrouther D.,Honma T.,Ringer S.P.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference19 articles.

1. Field-ion specimen preparation using focused ion-beam milling

2. Atom probe analysis of planar multilayer structures

3. Advances in Atom Probe Specimen Fabrication from Planar Multilayer Thin Film Structures

4. Information storage materials: nanoscale characterisation by three-dimensional atom probe analysis

5. Some aspects of atom probe specimen preparation and analysis of thin film materials

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