Minimum detection limit and spatial resolution of thin-sample field-emission electron probe microanalysis

Author:

Kubo Yugo,Hamada Kotaro,Urano Akira

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference22 articles.

1. Electron probe microanalysis;Castaing;Advances in Electronics and Electron Physics,1960

2. Electron Microprobe Analysis;Reed,1993

3. Scanning Electron Microscopy and X-ray Microanalysis;Goldstein,1992

4. Development of submicron analysis wavelength dispersive (WDS) EPMA with a field emission type electron gun;Kimura;Journal of Surface Analysis,2003

5. Spatial resolution of a wavelength-dispersive electron probe microanalyzer equipped with a thermal field emission gun;Kimura;Microchimica Acta,2006

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