Ion-beam modification of 2-D materials - single implant atom analysis via annular dark-field electron microscopy-Reference-Cited by-同舟云学术

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Ion-beam modification of 2-D materials - single implant atom analysis via annular dark-field electron microscopy

Published:2017-05 Issue: Volume:176 Page:31-36
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Bangert U.,Stewart A.,O’Connell E.,Courtney E.,Ramasse Q.,Kepaptsoglou D.,Hofsäss H.,Amani J.,Tu J.-S.,Kardynal B.

Funder

Irish Research Council (IRC)

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference32 articles.

1. Two-dimensional atomic crystals;Novoselov;Proc. Natl. Acad. Sci. Usa.,2005

2. Frictional characteristics of atomically thin sheets;Lee;Science,2010

3. Single-layer MoS2 transistors;Radisavljevic;Nat. Nanotechnol.,2011

4. Imaging MoS2 Nanocatalysts with Single-Atom Sensitivity;Kisielowski;Angew. Chem. Int. Ed.,2010

5. Atomic-scale edge structures on industrial-style MoS2 nanocatalysts;Hansen;Angew. Chem. - Int. Ed.,2011

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