Author:
Li Peng,Edo Tega B.,Rodenburg John M.
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference17 articles.
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5. R. Hegerl, W. Hoppe, Phase evaluation in generalized diffraction (ptychography), in: Proceedings of the Fifth European Congress Electron Microscopy, vol. 14, 1972, pp. 628–629 (Manchester).
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