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A memory efficient method for fully three-dimensional object reconstruction with HAADF STEM

  • Published:2014-06 Issue: Volume:141 Page:22-31
  • ISSN:0304-3991
  • Container-title:Ultramicroscopy
  • language:en
  • Short-container-title:Ultramicroscopy

Author:

Van den Broek W.,Rosenauer A.,Van Aert S.,Sijbers J.,Van Dyck D.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Cited by 9 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Model-based deconvolution for particle analysis applied to a through-focus series of HAADF-STEM images;Microscopy;2022-12-20

2. Notes and References;Principles of Electron Optics, Volume 4;2022

3. Fast approximate STEM image simulations from a machine learning model;Advanced Structural and Chemical Imaging;2019-03-12

4. The impact of STEM aberration correction on materials science;Ultramicroscopy;2017-09

5. Ultra-high resolution electron microscopy;Reports on Progress in Physics;2016-12-23
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