Novel carbon nanosheets as support for ultrahigh-resolution structural analysis of nanoparticles-Reference-Cited by-同舟云学术

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Novel carbon nanosheets as support for ultrahigh-resolution structural analysis of nanoparticles

Published:2008-08 Issue:9 Volume:108 Page:885-892
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Nottbohm Christoph T.,Beyer Andre,Sologubenko Alla S.,Ennen Inga,Hütten Andreas,Rösner Harald,Eck Wolfgang,Mayer Joachim,Gölzhäuser Armin

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference21 articles.

1. Sub-Ångstrom high-resolution transmission electron microscopy at 300keV

2. Semiconductor Nanocrystal Quantum Dots on Single Crystal Semiconductor Substrates: High Resolution Transmission Electron Microscopy

3. Sub-Nanometer Au Monolayer-Protected Clusters Exhibiting Molecule-like Electronic Behavior: Quantitative High-Angle Annular Dark-Field Scanning Transmission Electron Microscopy and Electrochemical Characterization of Clusters with Precise Atomic Stoichiometry

4. Two-dimensional atomic crystals

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