Atomic force microscopy and fourier transform infra-red studies of the influence of a highly oriented poly(tetrafluoroethylene) substrate on poly(ethylene terephthalate) overlayers-Reference-Cited by-同舟云学术

Atomic force microscopy and fourier transform infra-red studies of the influence of a highly oriented poly(tetrafluoroethylene) substrate on poly(ethylene terephthalate) overlayers

Published:1996-02 Issue:3 Volume:37 Page:523-526
ISSN:0032-3861
Container-title:Polymer
language:en
Short-container-title:Polymer

Author:

Hayes N.W.,Beamson G.,Clark D.T.,Clarke D.T.,Law D.S.-L.

Publisher

Elsevier BV

Subject

Polymers and Plastics,Materials Chemistry,Organic Chemistry

Reference17 articles.

1. Highly oriented thin films of poly(tetrafluoroethylene) as a substrate for oriented growth of materials

2. Polymer friction-transfer layers as orienting substrates

3. Highly oriented poly(di-n-alkylsilylene) films on oriented PTFE substrates

4. Molecular resolution of thin, highly oriented poly (tetrafluoroethylene) films with the atomic force microscope

5. Molecular structure and thickness of highly oriented poly(tetrafluoroethylene) films measured by atomic force microscopy

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