Growth of erbium-silicide films on (100) silicon as characterised by electron microscopy and diffraction
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics
Reference21 articles.
1. Epitaxial growth of rare‐earth silicides on (111) Si
2. Fabrication and structure of epitaxial Er silicide films on (111) Si
3. Infrared response of Pt/Si/ErSi1.7heterostructure: Tunable internal photoemission sensor
4. Si/ErSi1.7 interfaces and Si reepitaxy on the ErSi1.7/Si structure
5. Growth, characterization and electrical properties of epitaxial erbium silicide
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