In situ observation of ellipsometry monolayer oscillations of metalorganic vapor-phase epitaxy-grown III–V compound materials
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics
Reference18 articles.
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1. In-situ Surface Analysis;Epitaxy;2004
2. Growth and in situ analysis of InAs/InP quantum dot stack and its far infrared absorption properties;SPIE Proceedings;2003-07-02
3. Real time in situ monitoring of stacked InAs/InP quantum dots by spectral reflectance;Journal of Crystal Growth;2003-02
4. In-situ observation of MOVPE epitaxial growth;Applied Physics A: Materials Science & Processing;2002-07-01
5. Growth of Self-Organized Quantum Dots;Semiconductor Quantum Dots;2002
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