Author:
Chan D.S.H,Chim W.K,Phang J.C.H,Liu Y.Y,Ng T.H,Xiao H
Subject
Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics
Reference49 articles.
1. S.E. Leang, D.S.H. Chan, W.K. Chim, Proceedings of the IEEE International Reliability Physics Symposium, 1996, pp. 311–317.
2. Extraction of metal-oxide-semiconductor field-effect-transistor interface state and trapped charge spatial distributions using a physics-based algorithm
3. Determination of substrate doping, substrate carrier lifetime and density of surface recombination centres of MOSFETs by gate-controlled-diode measurements
4. Investigation of interface traps in LDD pMOST's by the DCIV method
5. B.B. Jie, M.F. Li, C.L. Lou, K.F. Lo, W.K. Chim, D.S.H. Chan, Proceedings of the Sixth International Symposium on the Physical and Failure Analysis of Integrated Circuits, 1997, pp. 176–181.