Quality assessment of Bridgman-grown CdTe single crystals using double-crystal X-ray diffractometry (DCD) and synchrotron radiation
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics
Reference5 articles.
1. X-ray double-crystal diffraction studies of CdTe/GaAs heteroepitaxial layers
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4. High quality, single crystal CdTe grown by a modified horizontal Bridgman technique
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