1. K. Tempelhoff, F. Spiegelberg, in: H.R. Huff, E. Sirtl (Eds.), Semiconductor Silicon/1977, PV 77, The Electrochemical Society Proceedings Series, Pennington, NJ, 1977, p. 585.
2. F.A. Ponce, T. Yamashita, S. Hahn, in: W. Murray Bullis, C. Kimerling (Eds.), Defect in Silicon/1983, PV 83–9, The Electrochemical Society Proceedings Series, Pennington, NJ, 1983, p. 105.
3. Oxygen precipitation in silicon
4. Dependence on Morphology of Oxygen Precipitates upon Oxygen Supersaturation in Czochralski Silicon Crystals
5. Crystal-Originated Singularities on Si Wafer Surface after SC1 Cleaning