Author:
Bäckström C,Irvine S.J.C,Barrioz V
Subject
Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics
Reference12 articles.
1. In situ monitoring of the MOCVD growth of CdS/CdTe
2. C. Pickering, J. Russell, D.A.O. Hope, R.T. Carline, A.D. Marrs, D.J. Robbins, A. Dann, CP449 Chara and Metro. for ULSI Tech. 1998 Conference, NIST, Washington, DC, 1998, pp. 341–345.
3. Real-time monitoring of MOVPE device growth by reflectance anisotropy spectroscopy and related optical techniques
4. Characterisation of surface roughness by laser light scattering: diffusely scattered intensity measurement
5. Quantifying the smoothing of GaN epilayer growth by in situ laser interferometry