Application of relativistic electrons for the quantitative analysis of trace elements-Reference-Cited by-同舟云学术

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Application of relativistic electrons for the quantitative analysis of trace elements

Published:1984-04 Issue:1-3 Volume:3 Page:279-282
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Hoffmann D.H.H.,Brendel C.,Genz H.,Löw W.,Richter A.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference14 articles.

1. Proton induced X-ray emission as a tool for trace element analysis

2. Analytical application of particle induced X-ray emission

3. Cross Sections forK-Shell Ionization by 2-MeV-Electron Impact

4. K-shell ionization by relativistic electrons

5. Z and E dependence and scaling behaviour of the K-shell ionization cross section for relativistic electron impact

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. K-shell ionization cross section of Si atoms by relativistic electrons;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1994-01

2. Some directions of research in the domain of energy dispersive x-ray fluorescence analysis;Soviet Atomic Energy;1991-06

3. Investigations on the valence state of Fe diluted in Cu by spectroscopy of the K x-ray energy shifts;Journal of Magnetism and Magnetic Materials;1984-11

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