ELemental concentrations from proton induced thick target X-ray yields-Reference-Cited by-同舟云学术

ELemental concentrations from proton induced thick target X-ray yields

Published:1990-04 Issue:1-4 Volume:49 Page:157-160
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Šmit Ž.,Budnar M.,Cindro V.,Kump P.,Ramšak V.,Ravnikar M.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference16 articles.

1. The analysis of thick target metal alloys

2. Secondary fluorescence correction in thick target pixe analysis

3. The analysis of the power approximation in thick target PIXE analysis

4. Surface roughness correction in thick target pixe analysis

5. An analytical cross-section formula for K X-ray production by protons

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