High resolution conversion electron spectroscopy of impurities in semiconductors-Reference-Cited by-同舟云学术

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High resolution conversion electron spectroscopy of impurities in semiconductors

Published:1992-01 Issue:1-2 Volume:63 Page:179-185
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Petersen Jon Wulff,Weyer G.,Svane A.,Holzschuh E.,Kundig W.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference15 articles.

1. Photoemission in Solids,1978

2. Proc. 15th Int. Conf. on Defects in Semiconductors,1989

3. See contributions to these Proceedings (E-MRS 1991 Spring Meeting, Strasbourg, France, Symposium F: nuclear Methods in Semiconductor Physics).

4. Internal conversion coefficients for all atomic shells

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3. Resonance behavior of internal conversion coefficients at lowγ-ray energy;Physical Review C;2010-02-26

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