Secondary electron emission from the entrance and exit surfaces of thin carbon foils under fast ion bombardment

Author:

Shi C.R.,Toh H.S.,Lo D.,Livi R.P.,Mendenhall M.H.,Zhang D.Z.,Tombrello T.A.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Cited by 22 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. A high performance Time-of-Flight detector applied to isochronous mass measurement at CSRe;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2010-12

2. Backward Secondary Electron Emission Yield of Thick Targets Induced by MeV Ions;Chinese Physics Letters;2000-09-01

3. A TOF spectrometer for elastic recoil detection;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1998-05

4. Simultaneous measurement of the average ion-induced electron emission yield and the mean charge for isotachic ions in carbon foils;Physical Review A;1997-02-01

5. Fluence dependent electron emission as a measure of surface modification induced by swift heavy ions;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-02

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