Ion beam analysis and microscopic characterization of natural topaz stones-Reference-Cited by-同舟云学术

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Ion beam analysis and microscopic characterization of natural topaz stones

Published:1987-09 Issue:2 Volume:28 Page:284-288
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Rubel M.,Bergsåker H.,Emmoth B.,Nagata S.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference23 articles.

1. Secondary Ion Mass Spectrometry SIMS IV;Reed,1984

2. Secondary Ion Mass Spectrometry SIMS IV;Nishimura,1984

3. Secondary Ion Mass Spectrometry SIMS II;Okano,1979

4. Applications of the Ion Microprobe to Geochemistry and Cosmochemistry

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Introductory preface;Springer Tracts in Modern Physics;1989

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