Author:
Torrisi L.,Calcagno L.,Zhu D.Z.,Sheng K.L.,Foti G.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
9 articles.
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1. Angular distribution of ejected atoms from Nd:YAG laser irradiating metals;Review of Scientific Instruments;2001-01
2. Uses of PIXE at low proton energies;Applied Surface Science;1990-09
3. PIXE measurements of Kr-sputtered TiN coatings;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1990-04
4. The role of the ionization and stopping cross sections in PIXE thin film thickness measurements;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1988-09
5. A comparison between pixe and rbs thin film thickness measurements in binary targets;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1987-12