Author:
Yoshiaki Mokuno ,Yuji Horino ,Akiyoshi Chayahara ,Masato Kiuchi ,Kanenaga Fujii ,Mamoru Satou ,Mikio Takai
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
7 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. PIXE-measurement of Kα X-ray production cross sections for 1-MeV C+-ions in thick samples of Si, Fe, Cu and Zn;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2019-07
2. Measurement of 1-MeV C-ion beam induced X-ray production cross sections of Fe, Nb, Ru, Ce and Ta;Journal of Physics: Conference Series;2018-12
3. Energy straggling induced errors in heavy-ion PIXE analysis;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1998-03
4. Application of MeV carbon ions for PIXE measurements in silicon and high-Tc superconductors;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-04
5. Analytical techniques in nuclear microprobes;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1995-09