Radiation damage of 2 MeV Si ions in Si0.75Ge0.25: optical measurements and damage modelling-Reference-Cited by-同舟云学术

Radiation damage of 2 MeV Si ions in Si0.75Ge0.25: optical measurements and damage modelling

Published:1996-05 Issue:1-4 Volume:112 Page:316-320
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Lindner J.K.N.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference11 articles.

3. these Proceedings;Priolo,1996

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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