Author:
Pfeifer B.,Lindner J.K.N.,Rauschenbach B.,Stritzker B.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
8 articles.
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1. Ion Beam-Induced Damages;Low-Energy Ion Irradiation of Materials;2022
2. Mechanisms of damage formation in semiconductors;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2009-08
3. Status and open problems in modeling of as-implanted damage in silicon;Materials Science in Semiconductor Processing;2003-02
4. Determination of damage profiles in semiconductors using differential reflectance;Journal of Materials Science: Materials in Electronics;2003
5. Radiation damage of 2 MeV Si ions in Si0.75Ge0.25: optical measurements and damage modelling;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-05